Links

SPM Textbook

STM Tutorial

another STM tutorial 

http://matlabs.clt.binghamton.edu/spm/spmcontents.htm

http://www.weizmann.ac.il/surflab/peter/afmworks/

References

 AFM Lithography

“Bias induced spatially resolved growth and removal of Si-oxide by atomic force microscopy”, Myhra S., Applied Physics A – Materials Science & Processing 76, 63-69(2003).

 “Nanooxidation using a scanning probe microscope: An analytical model based on field induced oxidation”, D. Stievenard, P.A. Fontaine and E. Dubois, Applied Physics Letters, 70, 3272(1997).

Books

Wiesendanger R., “Scanning Probe Microscopy and Spectroscopy”, Cambridge