AFM

The experiment will be performed in the multidisciplinary building.

The goals of the experiment:

1. Study the basic principals of operation of the atomic force microscope.
2. Characterize several substrates (silicon dioxide, gold leaf and gold deposited on silicon) using the AFM.
3. Perform lithography on a silicon dioxide substrate using the AFM and study of it characteristics.

Experimental Procedure:

The basics of operating the AFM will be demonstrated by the instructor. The surfaces of clean substrates of silicon dioxide and gold will then be scanned and characterized.

Lithography will be performed on the silicon dioxide surface, by applying a bias voltage between the surface and the AFM tip and oxidation of the surface. The then-created features will be studies and the relation between the applied voltage, the duration of the oxidation and the height of the created features will be explored.

STM

The goals of the experiment:

1. Study of the basic principles of operation of the scanning tunneling microscope.
2. Characterization of  a graphite substrate and of the gold substrates scanned with the AFM.

Experimental Procedure:

The basics of operating the STM will be presented to the students.

The surface of graphite will be scanned attempting atomic resolution.

The same gold substrates scanned by the AFM will be scanned by the STM. Using their knowledge of the operating principles of AFM and STM the students will compare the images will be performed by the students.